2004 |
The application of two dependent processes control management |
Lin S.、Lin,F、SU-FEN YANG、Han,J |
conference |
|
2005-04 |
CONTROLLING TWO DEPENDENT PROCESS STEPS WITH ADAPTIVE SAMPLING INTERVAL |
SU-FEN YANG、MAN-KWAN SHAN |
conference |
|
2003 |
Robust design of Power Switch Supply |
SU-FEN YANG、Lin,G、MAN-KWAN SHAN |
conference |
|
2004-08 |
Processes management for autocorrelated observations |
SU-FEN YANG |
conference |
|
2003 |
The effect of measurement error on two dependent processes |
SU-FEN YANG、Ho H |
conference |
|
2004 |
The application of two dependent processes control management |
Lin S.、Lin,F、SU-FEN YANG、Han,J |
conference |
|
2004 |
Synergy of Logistic Regression and Support Vector Machine |
YUAN-CHIN CHANG |
conference |
|
2003 |
Robust design of Power Switch Supply |
SU-FEN YANG、Lin,G、MAN-KWAN SHAN |
conference |
|
2003.11 |
Optimal processes control for two dependent process with a failure mechanism |
SU-FEN YANG、SU-FEN YANG |
article |
pdf(1189) |
2007.01 |
Effects of measurement error on controlling two dependent process steps |
SU-FEN YANG、Ho,Han-Wei、M. A. Rahim |
article |
pdf(982) |
2002 |
Improvement of car speed using Taguchi method |
SU-FEN YANG、Lin. G、Ho.S |
conference |
|
2004 |
Synergy of Logistic Regression and Support Vector Machine |
YUAN-CHIN CHANG |
conference |
|
2002 |
Image recognition using Taguchi method and artificial neural network |
SU-FEN YANG、Kao R、Lee,R |
conference |
|
2002-08 |
Statsiticsl process control for failure mechanisms |
SU-FEN YANG |
conference |
|
2002 |
Improvement of thickness using Taguchi method |
SU-FEN YANG、Tsia I. |
conference |
|
2002 |
Improvement of car speed using Taguchi method |
SU-FEN YANG、Lin. G、Ho.S |
conference |
|
2001 |
Process Adjustment for the thickness of thin gold films |
SU-FEN YANG、Kao |
conference |
|
2002 |
Image recognition using Taguchi method and artificial neural network |
SU-FEN YANG、Kao R、Lee,R |
conference |
|
2002 |
Improvement of thickness using Taguchi method |
SU-FEN YANG、Tsia I. |
conference |
|
2001 |
An approach to analysis CRT quality data |
SU-FEN YANG、Ho,H |
conference |
|
2001 |
Process Adjustment for the thickness of thin gold films |
SU-FEN YANG、Kao |
conference |
|
2000.03 |
Statistical process control for two-grade products |
SU-FEN YANG、SU-FEN YANG、Yang,Tar-Hsing |
article |
web page(950) |
2001 |
Effects of measurement error on the X-bar and S Control charts |
SU-FEN YANG、Chang .C |
conference |
|
2000 |
Economic design of indivisual X chart and cause-selecting chart under Weibull shock models |
SU-FEN YANG、Chen,I |
conference |
|
2000 |
Economic design of T^2 control chart under Taguchi loss function |
SU-FEN YANG、Wen,T |
conference |
|