Please use this identifier to cite or link to this item: https://ah.lib.nccu.edu.tw/handle/140.119/126238
題名: A systematic approach for integrated trend analysis-The case of etching
作者: 李沛錞
Lee, Pei-Chun
Wu, Feng-Shang
Shiu, Chun-Chi
Su*, Hsin-Ning
貢獻者: 圖檔所
關鍵詞: Bibliometric analysis ; Patent analysis ; Text-mining ; Trend analysis ; Etching
日期: Mar-2011
上傳時間: 19-Sep-2019
摘要: Understanding technology development trends is of critical importance to countries, industries and enterprises to be sustainable in global competition. Attempts have been made to establish trend analysis by bibliometric and patent analyses. Also text-mining uncovers hidden and important information from structured or unstructured documents which serve as knowledge carriers. This study aims to provide a systematic approach for integrated trend analysis that takes into account bibliometric analysis, patent analysis and text-mining analysis. Etching is selected as the case study for integrating trend analysis method proposed in this study. Also, validity and applicability of the integrated analysis are evaluated.
關聯: Technological Forecasting and Social Change, Vol.78, No.3, pp.386-407
資料類型: article
DOI: https://doi.org/10.1016/j.techfore.2010.08.006
Appears in Collections:期刊論文

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