dc.contributor | 法律系 | zh_Tw |
dc.creator (作者) | 沈宗倫 | zh_TW |
dc.creator (作者) | Shen, Chung-lun | zh_TW |
dc.date (日期) | 2010-03 | - |
dc.date.accessioned | 3-Jan-2019 16:14:16 (UTC+8) | - |
dc.date.available | 3-Jan-2019 16:14:16 (UTC+8) | - |
dc.date.issued (上傳時間) | 3-Jan-2019 16:14:16 (UTC+8) | - |
dc.identifier.uri (URI) | http://nccur.lib.nccu.edu.tw/handle/140.119/121718 | - |
dc.format.extent | 109 bytes | - |
dc.format.mimetype | text/html | - |
dc.relation (關聯) | 臺大法學論叢, Vol.39, No.1, pp.287-352 | - |
dc.subject (關鍵詞) | licensed patented products;the exhaustion doctrine;double royalties;semi-conductor foundry;the doctrine of essential features;the repair-reconstruction dichotomy;patent symmetry;main technique;supporting technique | en_US |
dc.subject (關鍵詞) | 合法專利物;權利耗盡原則;多重授權金;半導體代工;重要特徵原則;必要侵害原則;利益之對稱性;主要或關鍵技術;次要或非關鍵技術;功能耗竭; | zh_TW |
dc.title (題名) | 由權利耗盡原則論合法專利物之使用界限—以專利物組裝與修復為中心 | en_US |
dc.type (資料類型) | article | - |