| dc.contributor | 統計系 | |
| dc.creator (作者) | 張育瑋 | |
| dc.creator (作者) | Chang, Yu-Wei | |
| dc.creator (作者) | Tsai, Rung-Ching;Hsu, Nan-Jung | |
| dc.date (日期) | 2014-04 | |
| dc.date.accessioned | 21-九月-2022 11:44:47 (UTC+8) | - |
| dc.date.available | 21-九月-2022 11:44:47 (UTC+8) | - |
| dc.date.issued (上傳時間) | 21-九月-2022 11:44:47 (UTC+8) | - |
| dc.identifier.uri (URI) | http://nccur.lib.nccu.edu.tw/handle/140.119/142012 | - |
| dc.description.abstract (摘要) | A speeded item response model is proposed. We consider the situation where examinees may retain the harder items to a later test period in a time limit test. With such a strategy, examinees may not finish answering some of the harder items within the allocated time. In the proposed model, we try to describe such a mechanism by incorporating a speeded-effect term into the two-parameter logistic item response model. A Bayesian estimation procedure of the current model using Markov chain Monte Carlo is presented, and its performance over the two-parameter logistic item response model in a speeded test is demonstrated through simulations. The methodology is applied to physics examination data of the Department Required Test for college entrance in Taiwan for illustration. | |
| dc.format.extent | 105 bytes | - |
| dc.format.mimetype | text/html | - |
| dc.relation (關聯) | Psychometrika, 79(2), 255-274 | |
| dc.subject (關鍵詞) | item response model; Markov chain Monte Carlo; test speededness | |
| dc.title (題名) | A speeded item response model: leave the harder till later | |
| dc.type (資料類型) | article | |
| dc.identifier.doi (DOI) | 10.1007/S11336-013-9336-2 | |
| dc.doi.uri (DOI) | https://doi.org/10.1007/s11336-013-9336-2 | |
