學術產出-會議論文
| 題名 | Automatic Defect Recognition Model of Terminal Block Connectors using Transfer Learning |
| 作者 | 羅崇銘 Lo, Chung-Ming |
| 貢獻者 | 圖檔所 |
| 日期 | 2021-12 |
| 上傳時間 | 31-一月-2023 16:03:24 (UTC+8) |
| 關聯 | The 26th International Conference on Information Management & Practice (第26屆國際資訊管理暨實務研討會), Chinese Society of Information Management |
| 資料類型 | conference |
| dc.contributor | 圖檔所 | |
| dc.creator (作者) | 羅崇銘 | |
| dc.creator (作者) | Lo, Chung-Ming | |
| dc.date (日期) | 2021-12 | |
| dc.date.accessioned | 31-一月-2023 16:03:24 (UTC+8) | - |
| dc.date.available | 31-一月-2023 16:03:24 (UTC+8) | - |
| dc.date.issued (上傳時間) | 31-一月-2023 16:03:24 (UTC+8) | - |
| dc.identifier.uri (URI) | http://nccur.lib.nccu.edu.tw/handle/140.119/143065 | - |
| dc.format.extent | 121 bytes | - |
| dc.format.mimetype | text/html | - |
| dc.relation (關聯) | The 26th International Conference on Information Management & Practice (第26屆國際資訊管理暨實務研討會), Chinese Society of Information Management | |
| dc.title (題名) | Automatic Defect Recognition Model of Terminal Block Connectors using Transfer Learning | |
| dc.type (資料類型) | conference |