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題名 Automatic Defect Recognition Model of Terminal Block Connectors using Transfer Learning
作者 羅崇銘
Lo, Chung-Ming
貢獻者 圖檔所
日期 2021-12
上傳時間 31-一月-2023 16:03:24 (UTC+8)
關聯 The 26th International Conference on Information Management & Practice (第26屆國際資訊管理暨實務研討會), Chinese Society of Information Management
資料類型 conference
dc.contributor 圖檔所
dc.creator (作者) 羅崇銘
dc.creator (作者) Lo, Chung-Ming
dc.date (日期) 2021-12
dc.date.accessioned 31-一月-2023 16:03:24 (UTC+8)-
dc.date.available 31-一月-2023 16:03:24 (UTC+8)-
dc.date.issued (上傳時間) 31-一月-2023 16:03:24 (UTC+8)-
dc.identifier.uri (URI) http://nccur.lib.nccu.edu.tw/handle/140.119/143065-
dc.format.extent 121 bytes-
dc.format.mimetype text/html-
dc.relation (關聯) The 26th International Conference on Information Management & Practice (第26屆國際資訊管理暨實務研討會), Chinese Society of Information Management
dc.title (題名) Automatic Defect Recognition Model of Terminal Block Connectors using Transfer Learning
dc.type (資料類型) conference