Please use this identifier to cite or link to this item: https://ah.lib.nccu.edu.tw/handle/140.119/64827
DC FieldValueLanguage
dc.contributor應物所en_US
dc.creator李尚凡zh_TW
dc.creatorLee, Jung-Chuan ; Hsieh, Chih-Hsun ; Chang, Che-Chun ; Huang, Leng-Wei ; Lin, Lu-Kuei ; Lee, Shang-Fanen_US
dc.date2013.03en_US
dc.date.accessioned2014-03-21T10:01:25Z-
dc.date.available2014-03-21T10:01:25Z-
dc.date.issued2014-03-21T10:01:25Z-
dc.identifier.urihttp://nccur.lib.nccu.edu.tw/handle/140.119/64827-
dc.description.abstractWe fabricate Co/Pt and Co/Pd multilayers and measure magnetoresistance. Our data show clear anisotropic interface magnetoresistance (AIMR) effect, in which the resistance variation shows a different sign from Co films when external magnetic saturation fields are rotated from in-plane transverse to perpendicular direction of the film plane. The AIMR percentages increase with decreasing Co thickness for both multilayers when the Co thickness is larger than 2.5 nm. However, the AIMR decreases in Co/Pt for thinner Co but still increases in Co/Pd, thus, showing inverse dependence to Co thickness.en_US
dc.format.extent548097 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoen_US-
dc.relationJournal of Applied Physics, 113, 17C714en_US
dc.source.urihttp://dx.doi.org/10.1063/1.4795799en_US
dc.titleComparison of anistropic interface magnetoresistance in Co/Pt and Co/Pd multilayersen_US
dc.typearticleen
dc.identifier.doi10.1063/1.4795799en_US
dc.doi.urihttp://dx.doi.org/10.1063/1.4795799en_US
item.grantfulltextrestricted-
item.fulltextWith Fulltext-
item.languageiso639-1en_US-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.openairetypearticle-
item.cerifentitytypePublications-
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