Please use this identifier to cite or link to this item: https://ah.lib.nccu.edu.tw/handle/140.119/70508
DC FieldValueLanguage
dc.contributor應物所en_US
dc.creator李尚凡zh_TW
dc.creatorLiu, Y.C.;Chang, P.;Huang, S.Y.;Chang, L.J.;Lin, W.C. ; Lee, S.F. ; Hong, M. ; Kwo, J.en_US
dc.date2011-04en_US
dc.date.accessioned2014-10-09T07:51:16Z-
dc.date.available2014-10-09T07:51:16Z-
dc.date.issued2014-10-09T07:51:16Z-
dc.identifier.urihttp://nccur.lib.nccu.edu.tw/handle/140.119/70508-
dc.description.abstractWe report magneto-optical Kerr microscopy study of the magnetic reversal behavior of Fe3Si/GaAs(100) epitaxial thin films grown by molecular beam epitaxy. Results are described in the context of superconducting quantum interference device and Kerr effect vector magnetometry to study the magnetic switching behavior. By tuning the Fe concentration of the samples from 75% to 83%, we found that the ratio of uniaxial to cubic anisotropy constants γ (= |Ku/K1|) would tremendously vary from 0.06 to 0.3. When the field was applied along the easy axis of Fe3Si samples, a step feature was observed in the M-H loops. This feature has been resolved in the domain image by Kerr microscopy, in which we observed a two-switching behavior at the field where the step feature occurred. These can be qualitatively understood by considering the ratio γ.en_US
dc.format.extent2783634 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoen_US-
dc.relationJournal of Applied Physics,109(7),07D508en_US
dc.titleMagnetization reversal processes of epitaxial Fe3Si films on GaAs(001)en_US
dc.typearticleen
dc.identifier.doi10.1063/1.3556785-
dc.doi.urihttp://dx.doi.org/10.1063/1.3556785-
item.languageiso639-1en_US-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.cerifentitytypePublications-
item.grantfulltextrestricted-
item.fulltextWith Fulltext-
item.openairetypearticle-
Appears in Collections:期刊論文
Files in This Item:
File Description SizeFormat
07D508.pdf2.72 MBAdobe PDF2View/Open
Show simple item record

Google ScholarTM

Check

Altmetric

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.