Please use this identifier to cite or link to this item: https://ah.lib.nccu.edu.tw/handle/140.119/70511
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dc.contributor應物所en_US
dc.creator李尚凡zh_TW
dc.creatorHuang,S. Y. ; Liang,J. J. ; Hsu,S. Y. ; Lin,L. K. ; Tsai,T. C. ; Lee,S. F.en_US
dc.date2011-01en_US
dc.date.accessioned2014-10-09T07:51:56Z-
dc.date.available2014-10-09T07:51:56Z-
dc.date.issued2014-10-09T07:51:56Z-
dc.identifier.urihttp://nccur.lib.nccu.edu.tw/handle/140.119/70511-
dc.description.abstractA direct determination of the interfacial transparency on the basis of current-perpendicular-to-plane (CPP) resistances for Cu0.5Ni0.5/Nb layered system is presented. This particular realization has substantial significance for understanding the interfacial transport in such heterostructures. The unexpected large critical thickness for this weak ferromagnetic containing system can be attributed to the strong pair-breaking effect as a result of the high interfacial transparency. Besides, the strong pair-breaking also plays a decisive role in the occurrence of the dimensionality crossover of the temperature dependent upper critical magnetic field.en_US
dc.format.extent639013 bytes-
dc.format.mimetypeapplication/pdf-
dc.language.isoen_US-
dc.relationEuropean Physical Journal B,79(2),153-162en_US
dc.titleInvestigation of Cu0.5Ni0.5/Nb interface transparency by using current-perpendicular-to-plane measurementen_US
dc.typearticleen
dc.identifier.doi10.1140/epjb/e2010-10051-y-
dc.doi.urihttp://dx.doi.org/10.1140/epjb/e2010-10051-y-
item.grantfulltextrestricted-
item.openairecristypehttp://purl.org/coar/resource_type/c_18cf-
item.languageiso639-1en_US-
item.openairetypearticle-
item.cerifentitytypePublications-
item.fulltextWith Fulltext-
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