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題名 型II截略抽樣計劃下之加速壽命試驗
Accelerated Life Testing Under Type II Censoring Sample Plan作者 陳燕禎 貢獻者 曾勝滄
陳燕禎日期 1989 上傳時間 4-May-2016 14:24:07 (UTC+8) 參考文獻 參考資料 [1]張東生博士論文"挑選最可靠設計之研究，The Study on Selecting the Most Reliable Design" (1989) [2] Kielpinski. T. J. and Nelson W(1975) "Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions " ,1EEE Transaction Reliability, Vol R-24,No.5.pp310-320 [3]Kielpinski, T.J.and Nelson W.(1976),”Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions", Technometrics, Vol.18. No.l, pp 171-177. [4] Mann N.R., Schafer,R.E., and Singpurwalla, N.D.(1974), Methods for Statistical Analtsis of Reliability and Life Data. John Wiley and Sons. New York. [5]Meeker, W.Q. and Nelson W.,(1975)"Optimum Accelerated Life Tests for the Weibull and Extreme Value Distributions". IEEE Transactions on Reliability. Vol. R-24. No.5. pp 321-332. [6] Meeker, W. Jr and Hahn G.J.,(1977), “Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability". Technoruetrics, Vol.19. No.4. pp 381-404 [7] Neeker, W. Q. and Nelson W.,(1978), "Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value ,Distributions." Technometrics, Vol.20, No.2, pp 171-177. [8] Meeker. W.Q. Jr. (1984). "A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring". Technometrics. Vol.25. 110.2. pp 105-114. [9] Nelson, W. (1980). "Accelerated Life Testing Step-Stress Models and Data Analysis". IEEE Transactions on Reliability. Vol.R-29 No.2 PP 103-108. [10] Nelson, W., (1982) Applied Life Data Analysis. General Electric Co., New York . [11] Nelson.W.,"Analysis of Accelerated Life Test Data". IEEE. Transaction on Electrical Insulation. "Part I. The Arrhenius model and Graphical Methods",Vol.E1-6,No.4,1971,pp165-181,"partⅡ.Numerical Methods and Test Planing",EI-7,No.1.1972.pp36-55, "PartⅢ.Product Comparisons and Checks on the Validity of the Hodel and Data",EI-7,No.2,1972,pp 99-119. [12] Sweeny, H.C. and Gaylor ,D.W.(1965),"Design for Optimal Prediction in Simple Linear Regression", Journal of American Statistical Association,pp205-216 [13] Tobias, P.A., Trindade. D.C,(1986),Applied Reliability Van Nostrand Reinhold Company, New York. 描述 碩士
國立政治大學
統計學系資料來源 http://thesis.lib.nccu.edu.tw/record/#B2002005729 資料類型 thesis dc.contributor.advisor 曾勝滄 zh_TW dc.contributor.author (Authors) 陳燕禎 zh_TW dc.creator (作者) 陳燕禎 zh_TW dc.date (日期) 1989 en_US dc.date.accessioned 4-May-2016 14:24:07 (UTC+8) - dc.date.available 4-May-2016 14:24:07 (UTC+8) - dc.date.issued (上傳時間) 4-May-2016 14:24:07 (UTC+8) - dc.identifier (Other Identifiers) B2002005729 en_US dc.identifier.uri (URI) http://nccur.lib.nccu.edu.tw/handle/140.119/90495 - dc.description (描述) 碩士 zh_TW dc.description (描述) 國立政治大學 zh_TW dc.description (描述) 統計學系 zh_TW dc.description.tableofcontents 目錄 第一章 緒論……1 第一節 研究動機與目的……1 第二節 文獻探討……2 第三節 研究範圍與限制……2 第四節 本文架構……3 第二章 加速壽命試驗的模型簡介……4 第一節 前言……4 第二節 加速因子已知的加速模型……5 第三節 加速因子未知的加速模型……7 第四節 Step-stress及 Degraduation-model……12 第三章 ALT在型I截略抽樣下的最佳試驗計劃……15 第一節 前言……15 第二節 模型假設……15 第三節 估計方法和最佳化設計……17 第四章 ALT在型II截略抽樣下的最佳試驗計劃……22 第一節 前言……22 第二節 模型簡介及參數估計……22 第三節 最佳化準則……26 第四節 最佳化設計……28 第五章 結論……41 附錄一 型I截略的ATL設計理論……43 附錄二 Var(1nλd)的標準化……46 附錄三……52 附錄四……53 附錄五……53 附錄六……54 附錄七……55 參考資料……56 zh_TW dc.source.uri (資料來源) http://thesis.lib.nccu.edu.tw/record/#B2002005729 en_US dc.title (題名) 型II截略抽樣計劃下之加速壽命試驗 zh_TW dc.title (題名) Accelerated Life Testing Under Type II Censoring Sample Plan en_US dc.type (資料類型) thesis en_US dc.relation.reference (參考文獻) 參考資料 [1]張東生博士論文"挑選最可靠設計之研究，The Study on Selecting the Most Reliable Design" (1989) [2] Kielpinski. T. J. and Nelson W(1975) "Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions " ,1EEE Transaction Reliability, Vol R-24,No.5.pp310-320 [3]Kielpinski, T.J.and Nelson W.(1976),”Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions", Technometrics, Vol.18. No.l, pp 171-177. [4] Mann N.R., Schafer,R.E., and Singpurwalla, N.D.(1974), Methods for Statistical Analtsis of Reliability and Life Data. John Wiley and Sons. New York. [5]Meeker, W.Q. and Nelson W.,(1975)"Optimum Accelerated Life Tests for the Weibull and Extreme Value Distributions". IEEE Transactions on Reliability. Vol. R-24. No.5. pp 321-332. [6] Meeker, W. Jr and Hahn G.J.,(1977), “Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability". Technoruetrics, Vol.19. No.4. pp 381-404 [7] Neeker, W. Q. and Nelson W.,(1978), "Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value ,Distributions." Technometrics, Vol.20, No.2, pp 171-177. [8] Meeker. W.Q. Jr. (1984). "A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I Censoring". Technometrics. Vol.25. 110.2. pp 105-114. [9] Nelson, W. (1980). "Accelerated Life Testing Step-Stress Models and Data Analysis". IEEE Transactions on Reliability. Vol.R-29 No.2 PP 103-108. [10] Nelson, W., (1982) Applied Life Data Analysis. General Electric Co., New York . [11] Nelson.W.,"Analysis of Accelerated Life Test Data". IEEE. Transaction on Electrical Insulation. "Part I. The Arrhenius model and Graphical Methods",Vol.E1-6,No.4,1971,pp165-181,"partⅡ.Numerical Methods and Test Planing",EI-7,No.1.1972.pp36-55, "PartⅢ.Product Comparisons and Checks on the Validity of the Hodel and Data",EI-7,No.2,1972,pp 99-119. [12] Sweeny, H.C. and Gaylor ,D.W.(1965),"Design for Optimal Prediction in Simple Linear Regression", Journal of American Statistical Association,pp205-216 [13] Tobias, P.A., Trindade. D.C,(1986),Applied Reliability Van Nostrand Reinhold Company, New York. zh_TW
