| dc.contributor | 圖檔所 | |
| dc.creator (作者) | 李沛錞 | |
| dc.creator (作者) | Lee, Pei-Chun | |
| dc.creator (作者) | Wu, Feng-Shang | |
| dc.creator (作者) | Shiu, Chun-Chi | |
| dc.creator (作者) | Su*, Hsin-Ning | |
| dc.date (日期) | 2011-03 | |
| dc.date.accessioned | 19-Sep-2019 09:46:45 (UTC+8) | - |
| dc.date.available | 19-Sep-2019 09:46:45 (UTC+8) | - |
| dc.date.issued (上傳時間) | 19-Sep-2019 09:46:45 (UTC+8) | - |
| dc.identifier.uri (URI) | http://nccur.lib.nccu.edu.tw/handle/140.119/126238 | - |
| dc.description.abstract (摘要) | Understanding technology development trends is of critical importance to countries, industries and enterprises to be sustainable in global competition. Attempts have been made to establish trend analysis by bibliometric and patent analyses. Also text-mining uncovers hidden and important information from structured or unstructured documents which serve as knowledge carriers. This study aims to provide a systematic approach for integrated trend analysis that takes into account bibliometric analysis, patent analysis and text-mining analysis. Etching is selected as the case study for integrating trend analysis method proposed in this study. Also, validity and applicability of the integrated analysis are evaluated. | |
| dc.format.extent | 2603728 bytes | - |
| dc.format.mimetype | application/pdf | - |
| dc.relation (關聯) | Technological Forecasting and Social Change, Vol.78, No.3, pp.386-407 | |
| dc.subject (關鍵詞) | Bibliometric analysis ; Patent analysis ; Text-mining ; Trend analysis ; Etching | |
| dc.title (題名) | A systematic approach for integrated trend analysis-The case of etching | |
| dc.type (資料類型) | article | |
| dc.identifier.doi (DOI) | 10.1016/j.techfore.2010.08.006 | |
| dc.doi.uri (DOI) | https://doi.org/10.1016/j.techfore.2010.08.006 | |
