| dc.contributor | 資管系 | - |
| dc.creator (作者) | 郁方; 林苡晴 | - |
| dc.creator (作者) | Yu, Fang;Lin, Yi-Ching | - |
| dc.date (日期) | 2023-05 | - |
| dc.date.accessioned | 5-Oct-2023 13:35:19 (UTC+8) | - |
| dc.date.available | 5-Oct-2023 13:35:19 (UTC+8) | - |
| dc.date.issued (上傳時間) | 5-Oct-2023 13:35:19 (UTC+8) | - |
| dc.identifier.uri (URI) | http://nccur.lib.nccu.edu.tw/handle/140.119/147896 | - |
| dc.format.extent | 109 bytes | - |
| dc.format.mimetype | text/html | - |
| dc.relation (關聯) | The 2023 IEEE/ACM International Workshop on Testing for Deep Learning and Deep Learning for Testing with the 45th the IEEE/ACM International Conference on Software Engineering (DeepTest@ICSE2023), IEEE/ACM | - |
| dc.title (題名) | DeepSHAP Summary for Adversarial Example Detection | - |
| dc.type (資料類型) | conference | - |
| dc.identifier.doi (DOI) | 10.1109/DeepTest59248.2023.00010 | - |
| dc.doi.uri (DOI) | https://doi.org/10.1109/DeepTest59248.2023.00010 | - |
