DeepSHAP Summary for Adversarial Example Detection | Publication

Title	DeepSHAP Summary for Adversarial Example Detection
Creator	郁方; 林苡晴 Yu, Fang;Lin, Yi-Ching
Contributor	資管系
Date	2023-05
Date Issued	5-Oct-2023 13:35:19 (UTC+8)
Relation	The 2023 IEEE/ACM International Workshop on Testing for Deep Learning and Deep Learning for Testing with the 45th the IEEE/ACM International Conference on Software Engineering (DeepTest@ICSE2023), IEEE/ACM
Type	conference
DOI	https://doi.org/10.1109/DeepTest59248.2023.00010

dc.contributor	資管系	-
dc.creator (作者)	郁方; 林苡晴	-
dc.creator (作者)	Yu, Fang;Lin, Yi-Ching	-
dc.date (日期)	2023-05	-
dc.date.accessioned	5-Oct-2023 13:35:19 (UTC+8)	-
dc.date.available	5-Oct-2023 13:35:19 (UTC+8)	-
dc.date.issued (上傳時間)	5-Oct-2023 13:35:19 (UTC+8)	-
dc.identifier.uri (URI)	http://nccur.lib.nccu.edu.tw/handle/140.119/147896	-
dc.format.extent	109 bytes	-
dc.format.mimetype	text/html	-
dc.relation (關聯)	The 2023 IEEE/ACM International Workshop on Testing for Deep Learning and Deep Learning for Testing with the 45th the IEEE/ACM International Conference on Software Engineering (DeepTest@ICSE2023), IEEE/ACM	-
dc.title (題名)	DeepSHAP Summary for Adversarial Example Detection	-
dc.type (資料類型)	conference	-
dc.identifier.doi (DOI)	10.1109/DeepTest59248.2023.00010	-
dc.doi.uri (DOI)	https://doi.org/10.1109/DeepTest59248.2023.00010	-