| dc.creator (作者) | 楊素芬 | zh_TW |
| dc.creator (作者) | Yang, Su-Fen | - |
| dc.date (日期) | 2000 | en_US |
| dc.date.accessioned | 19-Dec-2008 14:53:47 (UTC+8) | - |
| dc.date.available | 19-Dec-2008 14:53:47 (UTC+8) | - |
| dc.date.issued (上傳時間) | 19-Dec-2008 14:53:47 (UTC+8) | - |
| dc.identifier.uri (URI) | https://nccur.lib.nccu.edu.tw/handle/140.119/18185 | - |
| dc.description.abstract (摘要) | A Shewhart X control chart is developed to monitor the process mean for large production runs. It has not been considered appropriate to monitor the process mean using the Shewhart X control chart for small production runs. In this paper we propose the design of X control chart to monitor the process mean for small production runs. For various combinations of the number of samples and the size of each sample, control coefficients of X control chart are computed by numerical methods. Using these results, the X control chart for small production runs is developed to monitor the process mean correctly. Finally, the design procedure of the X control chart for small production runs and the results of misusing the Shewhart X control chart are illustrated by an example. [ABSTRACT FROM AUTHOR] | - |
| dc.format | application/ | en_US |
| dc.language | en | en_US |
| dc.language | en-US | en_US |
| dc.language.iso | en_US | - |
| dc.relation (關聯) | Process Control and Quality, 11(5), 433-439 | en_US |
| dc.title (題名) | Statistical process control for short run manufacturing systems | en_US |
| dc.type (資料類型) | article | en |
| dc.identifier.doi (DOI) | 10.1163/156856600750250815 | en_US |
| dc.doi.uri (DOI) | http://dx.doi.org/10.1163/156856600750250815 | en_US |
