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題名 逐步應力加速型一區間設限下之允收抽樣計畫
Acceptance Sampling Plans under Step-stress Test and Type Ⅰ Interval Censoring Data
作者 陳信豪
Chen, Hsin-Hao
貢獻者 陳麗霞<br>蔡宗儒
Chen, Li-Shya<br>Tsai, Tzong-Ru
陳信豪
Chen, Hsin-Hao
關鍵詞 加速實驗
型一設限
區間設限
允收抽樣
Rayleigh分配
日期 2005
上傳時間 17-Sep-2009 18:46:33 (UTC+8)
摘要 在壽命檢測試驗中,當我們因故或基於實驗上的方便無法連續觀察檢驗產品時,可以採用區間設限方式進行試驗,此外,對於許多長壽命的零件與產品,我們很難在試驗結束之前觀測到足夠的試驗單位死亡個數,此時可以採用加速壽命試驗的方式進行試驗,此種試驗方法可使受測的試驗單位提早故障,以有效地減少試驗所需的時間,並達到縮減成本的目的。本論文結合逐步應力加速試驗、型一設限以及區間設限,探討當產品壽命服從Rayleigh分配時,如何建立壽命檢驗計畫,在給定生產者風險與消費者風險下,求出壽命檢驗計畫所需的最小樣本數,以及判定貨批是否接受的壽命檢定臨界值,並將以上結果編製成表,以利實務界使用。
In life test experiment we use interval censoring to complete it when we can not inspect the experiment units continuously due to some accidents or for convenience. Furthermore, it is difficult to obtain enough units of breakdown products for many long life components and products. At this moment we can adopt step-stress life test to proceed the experiment. Using this method we can make the test units breakdown early for reducing the time test needed effectively and save prime cost. In this thesis, acceptance sampling plans are established for Rayleigh lifetime data under step-stress and type I interval censoring scheme. The minimum sample sizes and the corresponding critical values of lifetime needed for test plans are found. Some tables are provided for the use of the proposed test plans.
參考文獻 Mann et al. (1974). Methods for Statistical Analysis of Reliability and Life Data, New York: Wiley.
Miller, R. and Nelson, W. (1983). Optimum Simple Step-Stress Plans for Accelerated Life Testing, IEEE Transactions on Reliability, 32, 59-65.
Nelson, W. (1990). Accelerated Testing: Statistical Models, Test Plans, and Data Analysis, New York: Wiley.
Meeker, W. Q. and Escobar, L. A. (1993). A Review of Recent Research and Curren Issues in Accelerated Testing, International Statistical Review, 61, 147-168.
Xiong, C. (1998). Inferences on A Simple Step-Stress Model with Type-II Censored Exponential Data, IEEE Transactions on Reliability, 47, 142-146.
Tseng, S. T. and Wen, Z. C. (2000). Step-Stress Accelerated Degradation Analysis for Highly Reliable Products, Journal of Quality Technology, 32, 209-216.
Lawless, J. F. (1982). Statistical Models and Methods for Lifetime Data, John Wiley & Sons, New York, NY.
Cheng, K. F. and Chen, C. H. (1988). Estimation of the Weibull Parameters with Grouped Data, Communications in Statistics -Theory Methods, 17, 325-341.
Lui, K. J., Steffey, D. and Pugh, J. K. (1993). Sample Size Determination for Grouped Exponential Obervations: A Cost Function Approach, Biometrical Journal, 35, 677-688.
Chen, Z. and Mi, J. (1996). Confidence Interval for the Mean of the Exponential Distribution, based on Grouped Data, IEEE Trans -actions on Reliability, 45, 671-677.
Meeker, W. Q. and Escobar, L. A. (1998). Statistical Methods for Reliability Data, New York: Wiley.
Aggarwala, R. (2001). Progressive Interval Censoring: Some Mathem- atical Results with Applications Inference, Communications in Statistics-Theory Methods, 30, 1921-1935.
Epstein, B. (1954). Truncated Life Tests in the Exponential Case, Annals of Mathematical Statistics, 25, pp. 555-564.
Spurrier, J. D. and Wei, L. J. (1980). A Test of the Parameter of the Exponential Distribution in the Type I Censoring Case, Journal of American Statistical Association, 75, pp. 405-409.
Grant, E. L. and Leavenworth, R. S. (1996). Statistical Quality Control, McGraw-Hill, New York, NY.
Kim, S. H. and Yum, B. J. (2000). Comparisons of Exponential Life Test Plans With Intermittent Inspections, Journal of Quality Technology, 32, 217-230.
飛利浦RF小信號分立元器件產品設計手冊, http://www.semiconductors.philips.com/acrobat/other/discretes/philips_rf_manual_4th_edition_appendix_chinese.pdf
A_open AX4PE Tube-g真空管極品主板試用手記, http://www.beareyes.com.cn/2/lib/200304/30/20030430216.htm
認識真空管, http://www.shanling.com/tube_01.html
描述 碩士
國立政治大學
統計研究所
93354017
94
資料來源 http://thesis.lib.nccu.edu.tw/record/#G0093354017
資料類型 thesis
dc.contributor.advisor 陳麗霞<br>蔡宗儒zh_TW
dc.contributor.advisor Chen, Li-Shya<br>Tsai, Tzong-Ruen_US
dc.contributor.author (Authors) 陳信豪zh_TW
dc.contributor.author (Authors) Chen, Hsin-Haoen_US
dc.creator (作者) 陳信豪zh_TW
dc.creator (作者) Chen, Hsin-Haoen_US
dc.date (日期) 2005en_US
dc.date.accessioned 17-Sep-2009 18:46:33 (UTC+8)-
dc.date.available 17-Sep-2009 18:46:33 (UTC+8)-
dc.date.issued (上傳時間) 17-Sep-2009 18:46:33 (UTC+8)-
dc.identifier (Other Identifiers) G0093354017en_US
dc.identifier.uri (URI) https://nccur.lib.nccu.edu.tw/handle/140.119/33905-
dc.description (描述) 碩士zh_TW
dc.description (描述) 國立政治大學zh_TW
dc.description (描述) 統計研究所zh_TW
dc.description (描述) 93354017zh_TW
dc.description (描述) 94zh_TW
dc.description.abstract (摘要) 在壽命檢測試驗中,當我們因故或基於實驗上的方便無法連續觀察檢驗產品時,可以採用區間設限方式進行試驗,此外,對於許多長壽命的零件與產品,我們很難在試驗結束之前觀測到足夠的試驗單位死亡個數,此時可以採用加速壽命試驗的方式進行試驗,此種試驗方法可使受測的試驗單位提早故障,以有效地減少試驗所需的時間,並達到縮減成本的目的。本論文結合逐步應力加速試驗、型一設限以及區間設限,探討當產品壽命服從Rayleigh分配時,如何建立壽命檢驗計畫,在給定生產者風險與消費者風險下,求出壽命檢驗計畫所需的最小樣本數,以及判定貨批是否接受的壽命檢定臨界值,並將以上結果編製成表,以利實務界使用。zh_TW
dc.description.abstract (摘要) In life test experiment we use interval censoring to complete it when we can not inspect the experiment units continuously due to some accidents or for convenience. Furthermore, it is difficult to obtain enough units of breakdown products for many long life components and products. At this moment we can adopt step-stress life test to proceed the experiment. Using this method we can make the test units breakdown early for reducing the time test needed effectively and save prime cost. In this thesis, acceptance sampling plans are established for Rayleigh lifetime data under step-stress and type I interval censoring scheme. The minimum sample sizes and the corresponding critical values of lifetime needed for test plans are found. Some tables are provided for the use of the proposed test plans.en_US
dc.description.tableofcontents 第一章 緒論 1
1.1 研究動機與目的 ............................ 1
1.2 論文架構 ................................. 3

第二章 文獻回顧 4

第三章 逐步應力加速區間型一設限試驗 7
3.1 試驗方法 ................................. 7
3.2 Rayleigh分配 ............................ 10
3.3 逐步應力加速區間型一設限試驗模型 ............ 11

第四章 逐步應力加速區間型一設限下之允收抽樣計畫 15
4.1 最大概似估計 ............................. 15
4.2 允收抽樣計畫 ............................. 17

第五章 模擬與例題 21
5.1 電腦模擬結果 .............................. 21
5.2 實例探討 ................................. 23

第六章 結論 32

參考文獻 34
zh_TW
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dc.source.uri (資料來源) http://thesis.lib.nccu.edu.tw/record/#G0093354017en_US
dc.subject (關鍵詞) 加速實驗zh_TW
dc.subject (關鍵詞) 型一設限zh_TW
dc.subject (關鍵詞) 區間設限zh_TW
dc.subject (關鍵詞) 允收抽樣zh_TW
dc.subject (關鍵詞) Rayleigh分配zh_TW
dc.title (題名) 逐步應力加速型一區間設限下之允收抽樣計畫zh_TW
dc.title (題名) Acceptance Sampling Plans under Step-stress Test and Type Ⅰ Interval Censoring Dataen_US
dc.type (資料類型) thesisen
dc.relation.reference (參考文獻) Mann et al. (1974). Methods for Statistical Analysis of Reliability and Life Data, New York: Wiley.zh_TW
dc.relation.reference (參考文獻) Miller, R. and Nelson, W. (1983). Optimum Simple Step-Stress Plans for Accelerated Life Testing, IEEE Transactions on Reliability, 32, 59-65.zh_TW
dc.relation.reference (參考文獻) Nelson, W. (1990). Accelerated Testing: Statistical Models, Test Plans, and Data Analysis, New York: Wiley.zh_TW
dc.relation.reference (參考文獻) Meeker, W. Q. and Escobar, L. A. (1993). A Review of Recent Research and Curren Issues in Accelerated Testing, International Statistical Review, 61, 147-168.zh_TW
dc.relation.reference (參考文獻) Xiong, C. (1998). Inferences on A Simple Step-Stress Model with Type-II Censored Exponential Data, IEEE Transactions on Reliability, 47, 142-146.zh_TW
dc.relation.reference (參考文獻) Tseng, S. T. and Wen, Z. C. (2000). Step-Stress Accelerated Degradation Analysis for Highly Reliable Products, Journal of Quality Technology, 32, 209-216.zh_TW
dc.relation.reference (參考文獻) Lawless, J. F. (1982). Statistical Models and Methods for Lifetime Data, John Wiley & Sons, New York, NY.zh_TW
dc.relation.reference (參考文獻) Cheng, K. F. and Chen, C. H. (1988). Estimation of the Weibull Parameters with Grouped Data, Communications in Statistics -Theory Methods, 17, 325-341.zh_TW
dc.relation.reference (參考文獻) Lui, K. J., Steffey, D. and Pugh, J. K. (1993). Sample Size Determination for Grouped Exponential Obervations: A Cost Function Approach, Biometrical Journal, 35, 677-688.zh_TW
dc.relation.reference (參考文獻) Chen, Z. and Mi, J. (1996). Confidence Interval for the Mean of the Exponential Distribution, based on Grouped Data, IEEE Trans -actions on Reliability, 45, 671-677.zh_TW
dc.relation.reference (參考文獻) Meeker, W. Q. and Escobar, L. A. (1998). Statistical Methods for Reliability Data, New York: Wiley.zh_TW
dc.relation.reference (參考文獻) Aggarwala, R. (2001). Progressive Interval Censoring: Some Mathem- atical Results with Applications Inference, Communications in Statistics-Theory Methods, 30, 1921-1935.zh_TW
dc.relation.reference (參考文獻) Epstein, B. (1954). Truncated Life Tests in the Exponential Case, Annals of Mathematical Statistics, 25, pp. 555-564.zh_TW
dc.relation.reference (參考文獻) Spurrier, J. D. and Wei, L. J. (1980). A Test of the Parameter of the Exponential Distribution in the Type I Censoring Case, Journal of American Statistical Association, 75, pp. 405-409.zh_TW
dc.relation.reference (參考文獻) Grant, E. L. and Leavenworth, R. S. (1996). Statistical Quality Control, McGraw-Hill, New York, NY.zh_TW
dc.relation.reference (參考文獻) Kim, S. H. and Yum, B. J. (2000). Comparisons of Exponential Life Test Plans With Intermittent Inspections, Journal of Quality Technology, 32, 217-230.zh_TW
dc.relation.reference (參考文獻) 飛利浦RF小信號分立元器件產品設計手冊, http://www.semiconductors.philips.com/acrobat/other/discretes/philips_rf_manual_4th_edition_appendix_chinese.pdfzh_TW
dc.relation.reference (參考文獻) A_open AX4PE Tube-g真空管極品主板試用手記, http://www.beareyes.com.cn/2/lib/200304/30/20030430216.htmzh_TW
dc.relation.reference (參考文獻) 認識真空管, http://www.shanling.com/tube_01.htmlzh_TW