| dc.contributor.advisor | 劉江彬 | zh_TW |
| dc.contributor.author (Authors) | 潘治良 | zh_TW |
| dc.contributor.author (Authors) | Pan ,Chih Liang | en_US |
| dc.creator (作者) | 潘治良 | zh_TW |
| dc.creator (作者) | Pan ,Chih Liang | en_US |
| dc.date (日期) | 2005 | en_US |
| dc.date.accessioned | 18-Sep-2009 09:38:00 (UTC+8) | - |
| dc.date.available | 18-Sep-2009 09:38:00 (UTC+8) | - |
| dc.date.issued (上傳時間) | 18-Sep-2009 09:38:00 (UTC+8) | - |
| dc.identifier (Other Identifiers) | G0923590391 | en_US |
| dc.identifier.uri (URI) | https://nccur.lib.nccu.edu.tw/handle/140.119/34372 | - |
| dc.description (描述) | 碩士 | zh_TW |
| dc.description (描述) | 國立政治大學 | zh_TW |
| dc.description (描述) | 科技管理研究所 | zh_TW |
| dc.description (描述) | 92359039 | zh_TW |
| dc.description (描述) | 94 | zh_TW |
| dc.description.abstract (摘要) | 近年來，提昇專利品質的觀念已在企業間蔓延開來，而擁有一套能夠有效衡量的分析評量工具，為企業評估專利價值的先決條件。目前坊間評估專利價值較普遍的方式為CHI Research所發展，以「專利引證資訊」及「專利數量」作為公式的計算基礎。然而專利之品質要素並非現行專利分析公式及其指標所能完全涵蓋及內化，與商業價值亦無直接對應關係。為了改善上述之問題，本研究試圖從實務的觀點出發，找出並分析品質優良之專利說明書，其共通之特色為何，以及如何評估專利實際替企業創造的利益。本研究擬就下列問題進行討論：問題一：目前常用的以「專利引證資訊」及「專利說明書可量化數據」為基礎之專利價值評量模式是否可靠？問題二：專利的品質與價值如何定義與區分開來評估？問題三：影響專利說明書品質之指標因子及流程為何？問題四：評估專利價值之流程應為何？問題五：由產業結構切入之專利評量模型可行性？本研究之架構乃由現有理論基礎配合產業實務，首先將專利之評估方式分成「品質」及「價值」兩階段。接著以TFT-LCD產業之著名訴訟專利及廣視角技術作為研究對象，討論擁有優良品質之專利其特色為何。再連結產業結構、價值鏈、供應鏈、產品結構、技術結構、營收結構等市場面議題以實證專利之價值，並分析探討本研究之專利評量模型可行性。最後，針對提出之問題歸納出研究結論，給予學界及產業界一個專利評量之方法參考。 | zh_TW |
| dc.description.abstract (摘要) | In recent years, the concept of improving patent quality is spread over companies and cooperations. Analysis system, as a tool for effectively measuring patent quality, is the prerequisite of patent evaluation. The most general way of patent evaluation is developed by CHI Research, which bases on the information of “patent citation” and “patent quantity” for formulas. However, the essential factor of the patent quality can not be suitably presented by the foregoing indices and formulas. Furthermore, there is no direct relationship between the commercial value and such evaluation process. In order to improve the evaluation process, this research focuses on analyzing the common characteristics of high quality patents and how to value the actual commercial profit earned by patents, form the points of views of practice. Therefore, the objects of the research were to answer the questions as the follows:1. Are the existing patent evaluation methodology which base on the information of “patent citation” and “countable indices in patent disclosure” dependable.2. How to define and evaluate “patent quality” and “patent value” respectively.3. What is the essential factors and evaluation process of patent quality.4. What is the evaluation process of patent value.5. The feasibility of patent evaluation model initialed from the industrial structure.This method of the research combines current theory and industry practice. First, the evaluation process is devided into two steps: “quality” and “value”. Then it takes TFT-LCD industry for example, by analyzing a famous litigation patent and VA technology to discuss the common characteristics of high quality patents. Then, from the business point of view, the research links with several indices such as industry structure, value chain, supply chain, product structure, technology structure and revenue structure to derive the patent value. The feasibility of patent evaluation model by this research will also be discussed. At last, the research summarize the result to present an evaluation methodology of patent quality and value, which may be a useful reference to industry and the academia. | en_US |
| dc.description.tableofcontents | 第一章 緒論 1 第一節 研究背景 1 第二節 研究動機 5 第三節 研究目的與研究問題 7 第四節 研究流程 8第二章 文獻回顧與分析 9 第一節 專利之特性 9 第二節 智慧資本理論之專利價值評估文獻 16 第三節 專利量化指標之專利價值評估文獻 20 第四節 專利說明書內容與專利價值關係之文獻 30 第五節 專利衡量表之專利價值評估文獻 34 第六節 專利侵權賠償金計算因子之文獻 38 第七節 文獻探討小結 40第三章 研究設計與方法 41 第一節 研究架構 41 第二節 研究範圍 44 第三節 研究限制 46第四章 TFT-LCD產業實務分析 47 第一節 TFT-LCD產業發展 47 第二節 TFT-LCD產業市場分析 67 第三節 廣視角與消除莫瑞（Moiré）技術介紹 73 第四節 TFT-LCD之智財交易及侵害訴訟 88第五章 專利評量之指標與方法論 97 第一節 專利品質與價值之定義 97 第二節 專利之品質評估 99 第三節 專利之價值評估 122 第四節 專利評量方法探討 141第六章 結論與建議 149 第一節 研究結論 149 第二節 研究貢獻 155 第三節 後續研究建議 156參考文獻 157附錄一 日本特許廳專利評價指標—移轉版 163附錄二 US 5,280,371號專利內容 166附錄三 US 5,280,371號專利同年度公告之專利被引用次數排名 168附錄四 US 5,280,371專利申請文件之原始申請權利項 169附錄五 Samsung之PVA技術關鍵專利 172 | zh_TW |
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| dc.language.iso | en_US | - |
| dc.source.uri (資料來源) | http://thesis.lib.nccu.edu.tw/record/#G0923590391 | en_US |
| dc.subject (關鍵詞) | 專利 | zh_TW |
| dc.subject (關鍵詞) | 品質 | zh_TW |
| dc.subject (關鍵詞) | 價值 | zh_TW |
| dc.subject (關鍵詞) | 評量 | zh_TW |
| dc.subject (關鍵詞) | Patent | en_US |
| dc.subject (關鍵詞) | Quality | en_US |
| dc.subject (關鍵詞) | Value | en_US |
| dc.subject (關鍵詞) | Evaluation | en_US |
| dc.title (題名) | 專利之品質與價值評量方法—以TFT-LCD產業為例 | zh_TW |
| dc.title (題名) | The Evaluation Method of Patent Quality and Value-Center on the Industry of TFT-LCD | en_US |
| dc.type (資料類型) | thesis | en |
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