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題名 Controlling over-adjusted process means and variances using VSI casue selecting control charts
作者 楊素芬;Chen, Wan-Yun
Yang, Su-Fen;Chen, Wan-Yun
貢獻者 政大統計系
關鍵詞 Control charts;Dependent process steps;Optimization technique;Markov chain
日期 2009-04
上傳時間 12-Dec-2013 18:07:43 (UTC+8)
摘要 Process adjusted unnecessarily is a common problem in statistical process control. Incorrect adjustment of a process may result in shifts in process mean, process variance, or both, ultimately affecting the quality of products. The article considers the variable process control scheme for two dependent process steps with incorrect adjustment. We construct the variable sampling interval (VSI) View the MathML source and View the MathML source control charts in order to effectively monitor the quality variable produced by the first process step with incorrect adjustment and the quality variable produced by the second process step with incorrect adjustment, respectively. The performance of the proposed VSI control charts is measured by the adjusted average time to signal (AATS) derived using a Markov chain approach. An example of process control for automobile braking system shows the application and performance of the proposed joint VSI View the MathML source and View the MathML source control charts in detecting small and median shifts in mean and variance for the two dependent process steps with incorrect adjustment. The performance of the VSI View the MathML source and View the MathML source control charts and the fixed sampling interval (FSI) View the MathML source and View the MathML source control charts are compared via the numerical analysis results. These demonstrate that the former is much faster in detecting shifts in mean and variance. Whenever quality engineers cannot specify the values of variable sampling intervals, the optimal VSI View the MathML source and View the MathML source control charts are suggested. Furthermore, the impacts of misusing View the MathML source charts to monitoring the process mean and variance in the second step are also investigated.
關聯 Expert Systems with Applications, 36(3), 7170-7182
資料類型 article
DOI http://dx.doi.org/10.1016/j.eswa.2008.08.064
dc.contributor 政大統計系en_US
dc.creator (作者) 楊素芬;Chen, Wan-Yunzh_TW
dc.creator (作者) Yang, Su-Fen;Chen, Wan-Yunen_US
dc.date (日期) 2009-04en_US
dc.date.accessioned 12-Dec-2013 18:07:43 (UTC+8)-
dc.date.available 12-Dec-2013 18:07:43 (UTC+8)-
dc.date.issued (上傳時間) 12-Dec-2013 18:07:43 (UTC+8)-
dc.identifier.uri (URI) http://nccur.lib.nccu.edu.tw/handle/140.119/62441-
dc.description.abstract (摘要) Process adjusted unnecessarily is a common problem in statistical process control. Incorrect adjustment of a process may result in shifts in process mean, process variance, or both, ultimately affecting the quality of products. The article considers the variable process control scheme for two dependent process steps with incorrect adjustment. We construct the variable sampling interval (VSI) View the MathML source and View the MathML source control charts in order to effectively monitor the quality variable produced by the first process step with incorrect adjustment and the quality variable produced by the second process step with incorrect adjustment, respectively. The performance of the proposed VSI control charts is measured by the adjusted average time to signal (AATS) derived using a Markov chain approach. An example of process control for automobile braking system shows the application and performance of the proposed joint VSI View the MathML source and View the MathML source control charts in detecting small and median shifts in mean and variance for the two dependent process steps with incorrect adjustment. The performance of the VSI View the MathML source and View the MathML source control charts and the fixed sampling interval (FSI) View the MathML source and View the MathML source control charts are compared via the numerical analysis results. These demonstrate that the former is much faster in detecting shifts in mean and variance. Whenever quality engineers cannot specify the values of variable sampling intervals, the optimal VSI View the MathML source and View the MathML source control charts are suggested. Furthermore, the impacts of misusing View the MathML source charts to monitoring the process mean and variance in the second step are also investigated.en_US
dc.format.extent 430111 bytes-
dc.format.mimetype application/pdf-
dc.language.iso en_US-
dc.relation (關聯) Expert Systems with Applications, 36(3), 7170-7182en_US
dc.subject (關鍵詞) Control charts;Dependent process steps;Optimization technique;Markov chainen_US
dc.title (題名) Controlling over-adjusted process means and variances using VSI casue selecting control chartsen_US
dc.type (資料類型) articleen
dc.identifier.doi (DOI) 10.1016/j.eswa.2008.08.064-
dc.doi.uri (DOI) http://dx.doi.org/10.1016/j.eswa.2008.08.064-