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題名 數據相關之二階製程管制
Two-step Process Control for Autocorrelated data作者 陳維倫
Chen, Wei-Lun貢獻者 楊素芬
陳維倫
Chen, Wei-Lun關鍵詞 autocorrelated
time series model
transfer model
cause-selecting control chart日期 2001 上傳時間 15-Apr-2016 16:10:16 (UTC+8) 摘要 Most products are produced by several process steps and have more than one interested quality characteristics. If each step of the process is independent, and the observations taken from the process are also independent then we may use Shewhart control chart at each step. However, in many processes, most production steps are dependent and the observations taken from the process are correlated. In this research, we consider the process has two dependent steps and the observations taken from the process are correlated over time. We construct the individual residual control chart to monitor the previous process and the cause-selecting control chart to monitor the current process. Then simulate all the states occur in the process and present the individual residual control chart and the cause-selecting control chart of the simulations. Furthermore compare the proposed control charts with the Hotelling T2 control chart. At last, we give an example to illustrate how to construct the proposed control 參考文獻 Alwan, L. C and Roberts, H. V. (1988),“Time-Series Modeling for Statistical Process Control ”. Journal of Business & Economic Statistics, Vol, 6, pp87-95.Alwan, L. C. (1992)“Effects of Autocorrelation on Control Chart Performance” Communications in Statistics-Theory, Vol.21(4) ,pp1025-1049.Box, G. E. P and Jenkins, G. M. (1976) “Time Series Analysis: Forecasting and Control ”(Revised edition), Holden Day, San Francisco.Gnandesikan, R. (1977) “Methods for Statistical Analysis of Multivariate Observation”Wiley, New York.Hu, J. S. and Roan, C. (1996), “Changes Patterns of Time Series-Based Control Charts”. Journal of Quality Technology, Vol.28, pp302-312.Johnson, N. and Wichern, D,“Applied Multivariate Statistical Analysis” Prentice-Hall, Englewood Cliffs, N.J.Montgomery, D. C. and Mastrangelo, G. M. (1991),“Some Statistical Process Control Methods for Autocorrelated Data”. Journal of Quality Technology, Vol.23, pp179-204.Peter, J. B and Richard, A. D. (1996)“Introduction to Time Series and Forecasting”Tsay, R. S. and Tiao, G. C. (1985) "Use of canonical analysis in time series modelidentification", Biometrika, Vol.72, pp299-315.Vasilopoulos, A. V. and Stamboulis, A. P. (1978), “Modification of Control Chart Limits in the Presence of Data Correlation”, Journal of Quality Technology, Vol.10, pp20-30.Wardell, D. G., Moskowitz, H., and Plante, R. D. (1992),“Control Charts in the Presence of Data Correlation”, Management Science Vol.38, pp1084-1105.Wardell, D. G., Moskowitz, H., and Plante, R. D. (1994),“Run-Length Distributions of Special-Cause Control Charts for Correlated Process”. Technometrics, Vol.36, pp3-17.Wardell, Wade, R. and Woodall, W. (1993), “ A Review and Analysis of Cause-Selecting Control Charts”. Journal of Quality Technology, Vol.25, pp 161-169.Wei Jiang, Tsui K-L and Woodall, W. (2000), “A New SPC Monitoring Method: The ARMA Chart” Technometrics Vol.42,pp399-410.吳柏林(Wu, 1995).“時間數列分析導論” 華泰書局出版林茂文(Lin, 1992).“時間數列分析與預測”華泰書局出版葉小蓁(Yeh, 1998).“時間序列分析與應用” 描述 碩士
國立政治大學
統計學系
88354013資料來源 http://thesis.lib.nccu.edu.tw/record/#A2002001355 資料類型 thesis dc.contributor.advisor 楊素芬 zh_TW dc.contributor.author (Authors) 陳維倫 zh_TW dc.contributor.author (Authors) Chen, Wei-Lun en_US dc.creator (作者) 陳維倫 zh_TW dc.creator (作者) Chen, Wei-Lun en_US dc.date (日期) 2001 en_US dc.date.accessioned 15-Apr-2016 16:10:16 (UTC+8) - dc.date.available 15-Apr-2016 16:10:16 (UTC+8) - dc.date.issued (上傳時間) 15-Apr-2016 16:10:16 (UTC+8) - dc.identifier (Other Identifiers) A2002001355 en_US dc.identifier.uri (URI) http://nccur.lib.nccu.edu.tw/handle/140.119/85142 - dc.description (描述) 碩士 zh_TW dc.description (描述) 國立政治大學 zh_TW dc.description (描述) 統計學系 zh_TW dc.description (描述) 88354013 zh_TW dc.description.abstract (摘要) Most products are produced by several process steps and have more than one interested quality characteristics. If each step of the process is independent, and the observations taken from the process are also independent then we may use Shewhart control chart at each step. However, in many processes, most production steps are dependent and the observations taken from the process are correlated. In this research, we consider the process has two dependent steps and the observations taken from the process are correlated over time. We construct the individual residual control chart to monitor the previous process and the cause-selecting control chart to monitor the current process. Then simulate all the states occur in the process and present the individual residual control chart and the cause-selecting control chart of the simulations. Furthermore compare the proposed control charts with the Hotelling T2 control chart. At last, we give an example to illustrate how to construct the proposed control en_US dc.description.tableofcontents 封面頁證明書致謝詞論文摘要目錄表目錄圖目錄1. INTRODUCTION2. THE PROCESS MODEL2.1 Assumptions and Notation2.2 The Possible Distribution of Xt and Yt2.3 Process Control for the Previous and Current process2.3.1 Establish the Individual Residual Chart to Monitor the Previous Process2.3.2 Establish the Cause-Selecting Control Chart to Monitor the Current Process2.4 Type I, Type II Error Probabilities and the Power of the Propose Control Chart3. Simulation Study and An Empirical Example3.1 Simulate 9 Process States3.1.1 Simulate state 1 in the process3.1.2 Simulate state 2 in the process3.1.3 Simulate state 3 in the process3.1.4 Simulate state 4 in the process3.1.5 Simulate state 5 in the process3.1.6 Simulate state 6 in the process3.1.7 Simulate state 7 in the process3.1.8 Simulate state 8 in the process3.1.9 Simulate state 9 in the process3.2 An Empirical Example3.3 Comparison the proposed control chart and Hotelling T2 control chart4. CONCLUSION5. REFERENCES6. APPENDICESAppendix 1 (the empirical data to build the proposed charts)Appendix 2 (the empirical data to build the proposed charts)Appendix 3 (the S-plus program to count ARL for the simulated 9 states data) zh_TW dc.source.uri (資料來源) http://thesis.lib.nccu.edu.tw/record/#A2002001355 en_US dc.subject (關鍵詞) autocorrelated en_US dc.subject (關鍵詞) time series model en_US dc.subject (關鍵詞) transfer model en_US dc.subject (關鍵詞) cause-selecting control chart en_US dc.title (題名) 數據相關之二階製程管制 zh_TW dc.title (題名) Two-step Process Control for Autocorrelated data en_US dc.type (資料類型) thesis en_US dc.relation.reference (參考文獻) Alwan, L. C and Roberts, H. V. (1988),“Time-Series Modeling for Statistical Process Control ”. Journal of Business & Economic Statistics, Vol, 6, pp87-95.Alwan, L. C. (1992)“Effects of Autocorrelation on Control Chart Performance” Communications in Statistics-Theory, Vol.21(4) ,pp1025-1049.Box, G. E. P and Jenkins, G. M. (1976) “Time Series Analysis: Forecasting and Control ”(Revised edition), Holden Day, San Francisco.Gnandesikan, R. (1977) “Methods for Statistical Analysis of Multivariate Observation”Wiley, New York.Hu, J. S. and Roan, C. (1996), “Changes Patterns of Time Series-Based Control Charts”. Journal of Quality Technology, Vol.28, pp302-312.Johnson, N. and Wichern, D,“Applied Multivariate Statistical Analysis” Prentice-Hall, Englewood Cliffs, N.J.Montgomery, D. C. and Mastrangelo, G. M. (1991),“Some Statistical Process Control Methods for Autocorrelated Data”. Journal of Quality Technology, Vol.23, pp179-204.Peter, J. B and Richard, A. D. (1996)“Introduction to Time Series and Forecasting”Tsay, R. S. and Tiao, G. C. (1985) "Use of canonical analysis in time series modelidentification", Biometrika, Vol.72, pp299-315.Vasilopoulos, A. V. and Stamboulis, A. P. (1978), “Modification of Control Chart Limits in the Presence of Data Correlation”, Journal of Quality Technology, Vol.10, pp20-30.Wardell, D. G., Moskowitz, H., and Plante, R. D. (1992),“Control Charts in the Presence of Data Correlation”, Management Science Vol.38, pp1084-1105.Wardell, D. G., Moskowitz, H., and Plante, R. D. (1994),“Run-Length Distributions of Special-Cause Control Charts for Correlated Process”. Technometrics, Vol.36, pp3-17.Wardell, Wade, R. and Woodall, W. (1993), “ A Review and Analysis of Cause-Selecting Control Charts”. Journal of Quality Technology, Vol.25, pp 161-169.Wei Jiang, Tsui K-L and Woodall, W. (2000), “A New SPC Monitoring Method: The ARMA Chart” Technometrics Vol.42,pp399-410.吳柏林(Wu, 1995).“時間數列分析導論” 華泰書局出版林茂文(Lin, 1992).“時間數列分析與預測”華泰書局出版葉小蓁(Yeh, 1998).“時間序列分析與應用” zh_TW