| dc.contributor | 資科系 | |
| dc.creator (作者) | Liao, Wen-Hung;Young, T.-J. | |
| dc.creator (作者) | 廖文宏 | zh_TW |
| dc.date (日期) | 2010 | |
| dc.date.accessioned | 20-May-2015 17:03:22 (UTC+8) | - |
| dc.date.available | 20-May-2015 17:03:22 (UTC+8) | - |
| dc.date.issued (上傳時間) | 20-May-2015 17:03:22 (UTC+8) | - |
| dc.identifier.uri (URI) | http://nccur.lib.nccu.edu.tw/handle/140.119/75198 | - |
| dc.description.abstract (摘要) | We present an extension to the well-known local binary pattern (LBP) feature descriptor. The newly defined descriptor known as extended local ternary pattern (ELTP) exhibits better noise resistivity than the original LBP, while maintaining computational simplicity. We further investigate the presence of uniform patterns in ELTP. With a slight modification in the definition of uniformity, it is found experimentally that uniform ELTP account for 80% of all patterns in texture images. Comparative performance analysis indicates that the proposed uniform ELTP is more effective than uniform LBP for texture classification tasks. © 2010 IEEE. | |
| dc.format.extent | 176 bytes | - |
| dc.format.mimetype | text/html | - |
| dc.relation (關聯) | Proceedings - 2010 IEEE International Symposium on Multimedia, ISM 2010 | |
| dc.subject (關鍵詞) | Comparative performance analysis; Descriptors; Feature descriptors; Local binary patterns; Local ternary patterns; Noise resistivity; Texture classification; Texture image; Uniform pattern; Textures | |
| dc.title (題名) | Texture classification using uniform extended local ternary patterns | |
| dc.type (資料類型) | conference | en |
| dc.identifier.doi (DOI) | 10.1109/ISM.2010.35 | |
| dc.doi.uri (DOI) | http://dx.doi.org/10.1109/ISM.2010.35 | |
