| dc.contributor | 政大統計系 | en_US |
| dc.creator (作者) | 楊素芬;林共進;洪祖全 | zh_TW |
| dc.creator (作者) | Yang, Su-Fen;Lin,Dennis K.J.;Hung, Tzu-Chen | en_US |
| dc.date (日期) | 2009-03 | en_US |
| dc.date.accessioned | 12-Dec-2013 18:07:59 (UTC+8) | - |
| dc.date.available | 12-Dec-2013 18:07:59 (UTC+8) | - |
| dc.date.issued (上傳時間) | 12-Dec-2013 18:07:59 (UTC+8) | - |
| dc.identifier.uri (URI) | http://nccur.lib.nccu.edu.tw/handle/140.119/62442 | - |
| dc.description.abstract (摘要) | The variation of the film thickness and associated increase in cost are vital problems to computer connector producers. However, no scientific adjustment method is currently available. Transfer function and engineering process control are proposed to adjust the production processes for improving the quality of the metallic film of the connectors and reducing the cost of production. The analyses of the confirmatory experiments from using the two proposed approaches show significant gains in quality improvement and cost reduction. Furthermore, the engineering process control approach reveals a better improvement over the transfer function approach. Thus this approach is recommended to improve the quality of the film thickness and reduce the production cost in the computer connector industry | en_US |
| dc.format.extent | 190266 bytes | - |
| dc.format.mimetype | application/pdf | - |
| dc.language.iso | en_US | - |
| dc.relation (關聯) | Journal of Process Control, 19(3), 498-505 | en_US |
| dc.subject (關鍵詞) | Engineering process control;Film thickness;Transfer function | en_US |
| dc.title (題名) | Improvement inconsistency of the metallic film thickness of computer connectors | en_US |
| dc.type (資料類型) | article | en |
| dc.identifier.doi (DOI) | 10.1016/j.jprocont.2008.05.003 | - |
| dc.doi.uri (DOI) | http://dx.doi.org/10.1016/j.jprocont.2008.05.003 | - |
