Please use this identifier to cite or link to this item: https://ah.lib.nccu.edu.tw/handle/140.119/33887
DC FieldValueLanguage
dc.contributor.advisor傅承德<br>余清祥zh_TW
dc.contributor.advisorFuh, Cheng-Der<br>Yue, Ching-Syangen_US
dc.contributor.author俞一唐zh_TW
dc.contributor.authorYu, I-Tangen_US
dc.creator俞一唐zh_TW
dc.creatorYu, I-Tangen_US
dc.date2003en_US
dc.date.accessioned2009-09-17T10:43:54Z-
dc.date.available2009-09-17T10:43:54Z-
dc.date.issued2009-09-17T10:43:54Z-
dc.identifierG0086354503en_US
dc.identifier.urihttps://nccur.lib.nccu.edu.tw/handle/140.119/33887-
dc.description國立政治大學zh_TW
dc.description統計研究所zh_TW
dc.description86354503zh_TW
dc.description92zh_TW
dc.description.abstract我們提供一個新的可靠度模型,DwACM,並提供一個模式選擇準則CCP,我們利用DwACM和CCP來選擇衰變量。zh_TW
dc.description.abstractWe propose a new reliability model, DwACM (Dichotomous-data with Auxiliary Continuous Measurements model) to describe a data set which consists of classical dichotomous response (Go or No Go) associated with a set of continuous auxiliary measurement. In this model, the lifetime of each individual is considered as a latent variable. Given the value of the latent variable, the dichotomous response is either 0 or 1\ndepending on if it fails or not at the measuring time. The continuous measurement can be regarded as observations of an underlying possible degradation candidate of which descending process is a function of the lifetime. Under the assumption that the failure of products is defined as the time at which the\ncontinuous measurement reaches a threshold, these two measurements can be linked in the proposed model. Statistical inference under this model are both in frequentist and Bayesian frameworks. To evaluate the continuous measurements, we provide a criterion, CCP (correct classification probability),\nto select the best degradation measurement. We also report our\nsimulation studies of the performances of parameters estimators and CCP.en_US
dc.description.tableofcontents1. INTRODUCTION 1\n\n1.1 Concepts and Data types of Reliability Analysis 1\n1.2 Electro-Explosive Device and Thermal Transient Testing 3\n1.3 A Motivating Example 4\n1.4 Overviews 6\n\n2.STATISTICAL BACKGROUNDS 8\n\n2.1 Reliability Data Analysis 8\n2.2 Accelerated Experiment 10\n2.3 EM-Algorithm 11\n2.4 Bootstrap Methods 14\n2.5 Markov Chain Monte Carlo Simulation 16\n\n3.RwACM MODEL 19\n\n3.1 Modeling a Degradation Measurement 19\n3.2 The Linkage of Two Types of Data 22\n\n4. MEASUREMENT SELECTION CRITERION 26\n\n4.1 General Concepts of the CCP 26\n4.2 The CCP to the Linear Degradation Model 28\n\n\n5. ESTIMATION PROCEDURES 33\n\n5.1 Frequentist Inferences 33\n5.2 Bayesian Inferences 37\n\n6. EXPERIMENTAL SETTINGS AND SIMULATION STUDIES 42\n\n6.1 Experiment Settings 42\n6.2 Simulation Studies 43\n\n7. CONCLUSION AND FUTURE RESEARCHES 57\n7.1 Conclusion 57\n7.2 Future Researches 58\n\nREFERENCES 60zh_TW
dc.format.extent72225 bytes-
dc.format.extent14520 bytes-
dc.format.extent16224 bytes-
dc.format.extent45706 bytes-
dc.format.extent86092 bytes-
dc.format.extent69785 bytes-
dc.format.extent92400 bytes-
dc.format.extent83387 bytes-
dc.format.extent730555 bytes-
dc.format.extent39924 bytes-
dc.format.extent28096 bytes-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.format.mimetypeapplication/pdf-
dc.language.isoen_US-
dc.source.urihttp://thesis.lib.nccu.edu.tw/record/#G0086354503en_US
dc.subject拔靴法zh_TW
dc.subject衰變量zh_TW
dc.subject二元資料zh_TW
dc.subject電火工品zh_TW
dc.subjectEM演算法zh_TW
dc.subjectbootstrap methoden_US
dc.subjectdegradation measurementen_US
dc.subjectdichotomous dataen_US
dc.subjectelectro-explosive deviceen_US
dc.subjectEM-algorithmen_US
dc.subjectlatent variablesen_US
dc.subjectMarkov Chain Monte Carloen_US
dc.subjectreliabilityen_US
dc.titleDichotomous-Data Reliability Models with Auxiliary Measurementszh_TW
dc.typethesisen
dc.relation.reference1.Dempster, A. P., Laird, N. M. and Rubin, D. B. (1977). Maximum likelihood from incompletezh_TW
dc.relation.referencedata via the EM algorithm (with discussion). Journal of the Royal Statistical Societyzh_TW
dc.relation.referenceB, 39, 1-38.zh_TW
dc.relation.reference2. Efron, B. and Tibshirani, R. J. (1993). An Introduction to the Bootstrap.zh_TW
dc.relation.referenceChapman \\& Hall, Inc., London.zh_TW
dc.relation.reference3. Gelfand, A. E. and Smith A. F. M. (1990). Sampling based approaches to calculatingzh_TW
dc.relation.referencemarginal densities.zh_TW
dc.relation.referenceJournal of the American Statistical Association 85, 398-409.zh_TW
dc.relation.reference4.Geman, S. and Geman, D. (1984). Stochastic relaxation, Gibbszh_TW
dc.relation.referencedistribution and the Bayesian restoration of images. IEEEzh_TW
dc.relation.referenceTrans. Pattn. Anal. Math. Intel., 6, 721-741.zh_TW
dc.relation.reference5. Gilks, W. R., Richardson, S. and Spiegelhalter, D. J. (1996).zh_TW
dc.relation.referenceMarkov Chain Monte Carlo in Practice. Chapman \\& Hall/CRC, London.zh_TW
dc.relation.reference6.Lawless, J. F. (1982). Statistical Models and Methods for Lifetime Data.zh_TW
dc.relation.referenceJohn Wiley \\& Sons, New York.zh_TW
dc.relation.reference7.. Hall, P. (1992). The Bootstrap and Edgeworth Expansion.zh_TW
dc.relation.referenceNew York: Springer-Verlag.zh_TW
dc.relation.reference8. Hastings, W. K. (1970). Monte carlo sampling methods usingzh_TW
dc.relation.referenceMarkov chains and their applications. Biometrika, 57,zh_TW
dc.relation.reference97-109.zh_TW
dc.relation.reference9. Hudak, S. J. Jr., Saxena, A., Bussi, R. J. and Malcolm, R.zh_TW
dc.relation.referenceC. (1978). Development of standard methods of testing and analyzingzh_TW
dc.relation.referencefatigue crack growth rate data. Technical Report AFML-TR-78-40zh_TW
dc.relation.referenceWestinghouse R \\& D Center, Westinghouse Electric Corporation,zh_TW
dc.relation.referencePittsburgh, PA 15235.zh_TW
dc.relation.reference10. Lu, C. J. and Meeker, W. Q. (1993). Using degradation measures to estimate a time-to-failure distribution.zh_TW
dc.relation.referenceTechnometrics, 35, 161-174.zh_TW
dc.relation.reference11. McLachlan, G. J. and Krishnan, T. (1997). The EM Algorithm and Extensions.zh_TW
dc.relation.referenceJohn Wiley \\& Sons, New York.zh_TW
dc.relation.reference12. Meeker, W. Q. and Escobar, L. A. (1998). Statistical Methods for Reliability Data.zh_TW
dc.relation.referenceJohn Wiley \\& Sons, New York.zh_TW
dc.relation.reference13. Meng, X. L. and Rubin, D. B. (1993). Maximum likelihood estimation via the ECM algorithmzh_TW
dc.relation.reference: a general framework.Biometrika B, 80, 267-278.zh_TW
dc.relation.reference14. Metropolis, N., Rosenbluth, A. W., Rosenbluth, M. N.,zh_TW
dc.relation.referenceTeller, A. H. and Teller, E (1953). Equations of state calculationszh_TW
dc.relation.referenceby fast computing machine. J. Chem. Phys, 21,zh_TW
dc.relation.reference1087-1091.zh_TW
dc.relation.reference15. Murphy, A, J. and Menichelli, V. J. (1979). Introduction to thermal transient testing.zh_TW
dc.relation.referenceTechnical report, Pasadena Scientific Industries.zh_TW
dc.relation.reference16. Sammel, M. D., Ryan, L. M. and Legler, J. M. (1997). Latent variable models for mixedzh_TW
dc.relation.referencediscrete and continuous outcomes. Journal of the Royal Statistical Societyzh_TW
dc.relation.referenceB, 59, 667-678.zh_TW
dc.relation.reference17. Taguchi, G. (1991).Taguchi Methods, Signal-to-Noise Ratio for Quality Evaluation}, Vol 3.zh_TW
dc.relation.referenceDearborn, MI: American Supplier Institute Press.zh_TW
dc.relation.reference18.Tierney, L. (1994). Markov chains for exploring posteriorzh_TW
dc.relation.referencedistributions (with discussion). Ann. Statist, 22,zh_TW
dc.relation.reference1701-1762.zh_TW
dc.relation.reference19. Tseng, S. T., Hamada, M. and Chiao, C. H. (1995). Using degradation data from a factorialzh_TW
dc.relation.referenceexperiment to improve fluorescent lamp reliability. Journal of Quality Technologyzh_TW
dc.relation.reference46, 130-133.zh_TW
dc.relation.reference20. Wei, G. C. G. and Tanner, M. A. (1990). A Monte Carlo implementation of the EM algorithmzh_TW
dc.relation.referenceand the poor man`s data augmentation algorithms.zh_TW
dc.relation.referenceJournal of the American Statistical Association 85, 699-704.zh_TW
dc.relation.reference21.Wu, C. F. J. and Hamada, M. (2000). Experiments Planning, Analysis, and Parameter Designzh_TW
dc.relation.referenceOptimization. John Wiley \\& Sons, New York.zh_TW
item.fulltextWith Fulltext-
item.languageiso639-1en_US-
item.openairecristypehttp://purl.org/coar/resource_type/c_46ec-
item.openairetypethesis-
item.grantfulltextopen-
item.cerifentitytypePublications-
Appears in Collections:學位論文
Files in This Item:
File Description SizeFormat
35450301.pdf70.53 kBAdobe PDF2View/Open
35450302.pdf14.18 kBAdobe PDF2View/Open
35450303.pdf15.84 kBAdobe PDF2View/Open
35450304.pdf44.63 kBAdobe PDF2View/Open
35450305.pdf84.07 kBAdobe PDF2View/Open
35450306.pdf68.15 kBAdobe PDF2View/Open
35450307.pdf90.23 kBAdobe PDF2View/Open
35450308.pdf81.43 kBAdobe PDF2View/Open
35450309.pdf713.43 kBAdobe PDF2View/Open
35450310.pdf38.99 kBAdobe PDF2View/Open
35450311.pdf27.44 kBAdobe PDF2View/Open
Show simple item record

Google ScholarTM

Check


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.